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Joint Test Action Group
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#	Item
731	ADM-VPX3-7V2 11th February 2013 Datasheet Revision: 1.0 Features Applications: Add to Reading List Source URL: www.alpha-data.com Language: English - Date: 2013-09-05 03:16:32 Reconfigurable computing Embedded systems Xilinx Field-programmable gate array VPX Joint Test Action Group Nvidia Ion PCI Express Synchronous dynamic random-access memory Electronic engineering Computer hardware Electronics
732	Specifications Item Description 【SLX600】 ARM7TDMI, ARM7TDMI-S, ARM7EJ-S, ARM720T, ARM9TDMI, ARM9E-S, ARM920T, ARM922T, ARM926EJ-S, ARM940T, ARM946E-S, Add to Reading List Source URL: www.acceleratedtechnology.com.tw Language: English - Date: 2013-09-24 04:32:45 Computing Embedded systems Microcontrollers IEEE standards Electronics manufacturing Joint Test Action Group STM32 Debugger ARM Cortex-M Computer architecture ARM architecture Electronics
733	Reducing Total System Cost with Low-Power 28-nm FPGAs WP[removed]White Paper Add to Reading List Source URL: www.altera.com Language: English - Date: 2012-04-02 18:56:35 Field-programmable gate array Altera Xilinx Application-specific integrated circuit Joint Test Action Group Sopc builder Embedded system SiliconBlue Technologies Nios II Electronic engineering Fabless semiconductor companies Electronics
734	FPGA-POWER/CLOCK/JTAG EXTERNAL JTAG/ETM CONNECTOR +VCC +VCC Add to Reading List Source URL: www.openjtag.org Language: English - Date: 2014-03-04 04:25:09 Electronics manufacturing Joint Test Action Group R8C IC power supply pin Manufacturing Electronics Embedded systems Electronic engineering
735	Breakthrough silicon scanning discovers backdoor in military chip (DRAFT of 05 March[removed]Sergei Skorobogatov Christopher Woods Add to Reading List Source URL: deeprecursion.com Language: English - Date: 2014-05-15 05:47:01 Electronics manufacturing Manufacturing IEEE standards Microcontrollers Joint Test Action Group Power analysis Boundary scan Field-programmable gate array TI MSP430 Electronics Electronic engineering Embedded systems
736	In the blink of an eye: There goes your AES key (DRAFT of 28 May[removed]Sergei Skorobogatov Christopher Woods Add to Reading List Source URL: deeprecursion.com Language: English - Date: 2014-05-15 05:47:01 Advanced Encryption Standard Power analysis Side channel attack Microcontrollers Stream ciphers Message authentication codes Joint Test Action Group Field-programmable gate array TI MSP430 Cryptography Electronic engineering Electronics
737	Psyent PCI-5441 Corporation Add to Reading List Source URL: www.psyent.com Language: English - Date: 2005-03-25 14:28:04 Electronics IBM PC compatibles Digital signal processors Electronics manufacturing Joint Test Action Group PCI Express Field-programmable gate array Conventional PCI Embedded system Computer hardware Computer buses Computing
738	MAX[removed]Low Voltage Burn-in and Test System Add to Reading List Source URL: www.aehr.com Language: English - Date: 2009-03-18 18:13:21 Manufacturing Biasing Joint Test Action Group Technology Electronic test equipment Electronics Electronic engineering Electronics manufacturing
739	MAX -3 Low Voltage Burn-in and Test System Add to Reading List Source URL: www.aehr.com Language: English - Date: 2012-09-27 14:28:08 Manufacturing Joint Test Action Group Biasing Technology Electronic test equipment Electronics Electronics manufacturing Embedded systems
740	1-Wire Interface on the OMAP Matthew Percival 19th July 2005 Contents 1 The Usual Business Add to Reading List Source URL: www.capgo.com Language: English - Date: 2013-10-16 02:26:00 Digital signal processors ARM architecture 1-Wire OMAP Interrupt TI MSP430 Joint Test Action Group Computer architecture Instruction set architectures Microcontrollers

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